Basic of ICP-OES method is measurement of atomic emission with use of optical spectroscope technique. Samples are being converted into a fog form and prepared aerosol is being moved to plasma torch, where activation takes place. In plasma inductively activated by high frequencies, characteristic spectrum of atomic lines emission appears. Such spectrums are being split on diffraction net of spectrometer and their intensiveness is being monitored by detectors. Signals coming from detectors are being processed and controlled by a computer system. In order to compensate varying background distribution when testing trace elements, a technique of background correction is being used.
Optical spectometrics emission ICP-OES plays significant role among spectroscope methods. Specificity, sensitivity, relative simplicity and quickness of conducting analysis, due to commonly available instruments, this method becomes one of the most usable methods of chemical analysis.
Most of known elements can be tested using ICP-OES method with limits of detection on ppb level.
Significant advantage of ICP-OES method is a possibility of simultaneous testing of a group of elements. Potential possibility of multi-elemental testing comes up, due to the fact that emission signals, necessary for acquiring quality and quantity information, are emitted by all activated individuals simultaneously.